Duda, Richard O. <br/><br/>
Pattern Classification 

 - 2nd ed. 
 - New York :   Wiley,   2001. 
 - xx, 654 p. 
<br/><br/>1- Introduction;2- Bayesian decision theory;3- Maximum-Likelihood and bayesian parameter estimation;4- Nonpara metric techniques;5- Linear discriminant functions;6- Multilayer neural networks;7- Stochastic methods;8- Nonmetric methods;9- Algorithm-independent machine learning;10- Unsupervised learning and clustering 
<br/><br/><label>ISBN: </label>0471056693 
<br/><br/><label>Subjects--Topical Terms: </label><br/>MATEMATICAS APLICADAS A SEŅALES<br/>RESOLUCION ESTADISTICA<br/>CLASIFICACION DEL PATRON
<br/><br/><label>Universal Decimal Class. No.: </label>519.22